Lead Expert – Etch, Deposition, ALD & Metallization Metrology

About Nearfield Instruments

Nearfield Instruments (NFI) is a fast-growing, high-tech scale-up. We design, develop, integrate, market, and service advanced metrology machines. Our solutions enable the world’s leading chipmakers to increase production yield and improve device performance—powering smaller, faster, and more energy-efficient electronics.

Nearfield brings together leading experts in science and engineering to develop a unique, high-throughput Scanning Probe Microscopy (SPM) platform delivering true 3D, sub-nanometer resolution metrology at production scale.

We are looking for a senior semiconductor expert with deep experience in etching, thin-film deposition, atomic layer deposition (ALD), and metallization, gained within a leading-edge fab, research institute, or semiconductor equipment company.

This expert will lead Nearfield Instruments’ application and technology direction for advanced patterning, thin-film formation, conformal deposition, and metal integration. The role will identify the most critical process-control challenges, translate them into clear metrology requirements, and drive the development of new applications, capabilities, and product features that create greater value for customers.

Key responsibilities include: